The NTIS website and supporting ordering systems are undergoing a major upgrade from 8PM on September 25th through approximately October 6. During that time, much of the functionality, including subscription and product ordering, shipping, etc., will not be available. You may call NTIS at 1-800-553-6847 or (703) 605-6000 to place an order but you should expect delayed shipment. Please do NOT include credit card numbers in any email you might send NTIS.
Documents in the NTIS Technical Reports collection are the results of federally funded research. They are directly submitted to or collected by NTIS from Federal agencies for permanent accessibility to industry, academia and the public.  Before purchasing from NTIS, you may want to check for free access from (1) the issuing organization's website; (2) the U.S. Government Printing Office's Federal Digital System website http://www.gpo.gov/fdsys; (3) the federal government Internet portal USA.gov; or (4) a web search conducted using a commercial search engine such as http://www.google.com.
Accession Number N20130010982
Title Prognostics of Power Electronics, Methods and Validation Experiments.
Publication Date Sep 2012
Media Count 6p
Personal Author C. S. Kulkarni G. Biswas J. R. Celaya K. Goebel
Abstract Abstract Failure of electronic devices is a concern for future electric aircrafts that will see an increase of electronics to drive and control safety-critical equipment throughout the aircraft. As a result, investigation of precursors to failure in electronics and prediction of remaining life of electronic components is of key importance. DC-DC power converters are power electronics systems employed typically as sourcing elements for avionics equipment. Current research efforts in prognostics for these power systems focuses on the identification of failure mechanisms and the development of accelerated aging methodologies and systems to accelerate the aging process of test devices, while continuously measuring key electrical and thermal parameters. Preliminary model-based prognostics algorithms have been developed making use of empirical degradation models and physics-inspired degradation model with focus on key components like electrolytic capacitors and power MOSFETs (metal-oxide- semiconductor-field- effect-transistor). This paper presentscurrent results on the development of validation methods for prognosticsalgorithms of power electrolytic capacitors. Particularly, in the use ofaccelerated aging systems for algorithm validation. Validation of prognostics algorithms present difficulties in practice due to the lack of run-to-failure experiments in deployed systems. By using accelerated experiments, we circumvent this problem in order to define initial validation activities.
Keywords Accelerated life tests
Aging(Materials)
Avionics
Capacitors
Control equipment
Degradation
Field effect transistors
Metal oxide semiconductors
Power converters
Safety
System failures
Voltage converters(Dc to dc)


 
Source Agency National Aeronautics and Space Administration
NTIS Subject Category 49 - Electrotechnology
97I - Electric Power Production
Corporate Author National Aeronautics and Space Administration, Moffett Field, CA. Ames Research Center.
Document Type Conference proceedings
Title Note N/A
NTIS Issue Number 1320
Contract Number NNA08CG83C

Science and Technology Highlights

See a sampling of the latest scientific, technical and engineering information from NTIS in the NTIS Technical Reports Newsletter

Acrobat Reader Mobile    Acrobat Reader