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Accession Number
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N20120014270
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Title
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Challenges for Radiation Hardness Assurance (RHA) on Power MOSFETs.
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Publication Date
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Jun 2012
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Media Count
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28p
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Personal Author
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J. M. Lauenstein
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Abstract
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No abstract available
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Keywords
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Failure modes
Field effect transistors
Linear energy transfer(Let)
Metal oxide semiconductors
Radiation hardening
Silicon junctions
Single event upsets
Substrates
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Source Agency
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National Aeronautics and Space Administration
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NTIS Subject Category
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49 - Electrotechnology
49H - Semiconductor Devices
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Corporate Author
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Goddard Space Flight Center, Greenbelt, MD.
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Document Type
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Technical report
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Title Note
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N/A
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NTIS Issue Number
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1307
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Contract Number
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N/A
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