Accession Number N20120014270
Title Challenges for Radiation Hardness Assurance (RHA) on Power MOSFETs.
Publication Date Jun 2012
Media Count 28p
Personal Author J. M. Lauenstein
Abstract No abstract available
Keywords Failure modes
Field effect transistors
Linear energy transfer(Let)
Metal oxide semiconductors
Radiation hardening
Silicon junctions
Single event upsets

Source Agency National Aeronautics and Space Administration
NTIS Subject Category 49 - Electrotechnology
49H - Semiconductor Devices
Corporate Author Goddard Space Flight Center, Greenbelt, MD.
Document Type Technical report
Title Note N/A
NTIS Issue Number 1307
Contract Number N/A

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