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Accession Number N20120014269
Title Recent Power Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) Test Results.
Publication Date Jun 2012
Media Count 8p
Personal Author J. M. Lauenstein
Abstract No abstract available
Keywords Bias
Electric current
Electric power transmission
Electronic equipment
Field effect transistors
Gallium nitrides
Metal oxide semiconductors
Radiation dosage
Radiation hardening
Silicon carbides
Silicon junctions


 
Source Agency National Aeronautics and Space Administration
NTIS Subject Category 49 - Electrotechnology
49H - Semiconductor Devices
Corporate Author Goddard Space Flight Center, Greenbelt, MD.
Document Type Technical report
Title Note N/A
NTIS Issue Number 1307
Contract Number N/A

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