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Accession Number N20120013473
Title Systematic Destruction of Electronic Parts for Aid in Electronic Failure Analysis.
Publication Date Jun 2012
Media Count 48p
Personal Author P. D. McManus S. E. Decker T. D. Rolin
Abstract NASA analyzes electrical, electronic, and electromechanical (EEE) parts used in space vehicles to understand failure modes of these components. Operational amplifiers and transistors are two examples of EEE parts critical to NASA missions that can fail due to electrical overstress (EOS). EOS is the result of voltage or current over time conditions that exceeds a component s specification limit. The objective of this study was to provide known voltage pulses over well-defined time intervals to determine the type and extent of damage imparted to the device. The amount of current was not controlled but measured so that pulse energy was determined. The damage was ascertained electrically using curve trace plots and optically using various metallographic techniques. The resulting data can be used to build a database of physical evidence to compare to damaged components removed from flight avionics. The comparison will provide the avionics failure analyst necessary information about voltage and times that caused flight or test failures when no other electrical data is available.
Keywords Avionics
Electric potential
Electromechanics
Failure analysis
Failure modes
Flight tests
Nasa programs
Operational amplifiers
Transistors


 
Source Agency National Aeronautics and Space Administration
NTIS Subject Category 49 - Electrotechnology
Corporate Author National Aeronautics and Space Administration, Huntsville, AL. George C. Marshall Space Flight Center.
Document Type Technical report
Title Note N/A
NTIS Issue Number 1306
Contract Number N/A

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