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Accession Number N20120012921
Title Characterization of the Vectron PX-570 Crystal Oscillator for Use in Harsh Environments.
Publication Date May 2012
Media Count 10p
Personal Author A. Hammoud J. Li R. L. Patterson
Abstract Computing hardware, data-acquisition systems, communications systems, and many electronic control systems require well-controlled timing signals for proper and accurate operation. These signals are, in most cases, provided by circuits that employ crystal oscillators due to availability, cost, ease of operation, and accuracy. In some cases, the electronic systems are expected to survive and operate under harsh conditions that include exposure to extreme temperatures. These applications exist in terrestrial systems as well as in aerospace products. Well-logging, geothermal systems, and industrial process control are examples of ground-based applications, while distributed jet engine control in aircraft, space-based observatories (such as the James Webb Space Telescope), satellites, and lunar and planetary landers are typical environments where electronics are exposed to harsh operating conditions. To ensure these devices produce reliable results, the digital heartbeat from the oscillator must deliver a stable signal that is not affected by external temperature or other conditions. One such solution is a recently introduced commercial-off-the-shelf (COTS) oscillator, the PX-570 series from Vectron International. The oscillator was designed for high-temperature applications and as proof, the crystal oscillator was subjected to a wide suite of tests to determine its ruggedness for operation in harsh environments. The tests performed by Vectron included electrical characterization under wide range of temperature, accelerated life test/aging, shock and vibration, internal moisture analysis, ESD threshold, and latch-up testing. The parametric evaluation was performed on the oscillator's frequency, output signal rise and fall times, duty cycle, and supply current over the temperature range of -125 C to +230 C.
Keywords Characterization
Cryogenics
Crystal oscillators
Fabrication
Frequency stability
High temperature environments
High temperature tests
Mechanical shock
Stress distribution
Stress measurement
Temperature dependence
Temperature effects
Thermal cycling tests
Vibration tests

 
Source Agency National Aeronautics and Space Administration
NTIS Subject Category 49 - Electrotechnology
Corporate Author National Aeronautics and Space Administration, Cleveland, OH. NASA John H. Glenn Research Center at Lewis Field.
Document Type Conference proceedings
Title Note N/A
NTIS Issue Number 1303
Contract Number NNC06BA07B

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