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Accession Number
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DE92041176
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Title
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Determination of the strain field from an HREM image of a Si Lomer dislocation.
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Publication Date
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Mar 1992
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Media Count
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3p
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Personal Author
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K. H. Tsai A. F. Schwartzman R. Gallego M. Ortiz K. S. Kim
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Abstract
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A new approach to quantitative deformation characterization of high-resolution electron microscopy (HREM) defect images has been developed. The principle of this technique, (Computational Fourier Transform Deformation (CFTD)) is to extract an accurate dis ...
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Keywords
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Deformation
Dislocations
EDB/360602
EDB/360603
EDB/400101
Electron Microscopy
Fourier Transformation
Image Processing
Images
Meetings
Silicon
Simulation
Strains
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Source Agency
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Technical Information Center Oak Ridge Tennessee
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NTIS Subject Category
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99F - Physical & Theoretical Chemistry
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Corporate Author
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Lawrence Berkeley Lab., CA.
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Document Type
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Conference proceedings
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Title Note
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N/A
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NTIS Issue Number
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9308
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Contract Number
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AC03-76SF00098
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