Accession Number DE92041176
Title Determination of the strain field from an HREM image of a Si Lomer dislocation.
Publication Date Mar 1992
Media Count 3p
Personal Author K. H. Tsai A. F. Schwartzman R. Gallego M. Ortiz K. S. Kim
Abstract A new approach to quantitative deformation characterization of high-resolution electron microscopy (HREM) defect images has been developed. The principle of this technique, (Computational Fourier Transform Deformation (CFTD)) is to extract an accurate dis ...
Keywords Deformation
Dislocations
EDB/360602
EDB/360603
EDB/400101
Electron Microscopy
Fourier Transformation
Image Processing
Images
Meetings
Silicon
Simulation
Strains
 
Source Agency Technical Information Center Oak Ridge Tennessee
NTIS Subject Category 99F - Physical & Theoretical Chemistry
Corporate Author Lawrence Berkeley Lab., CA.
Document Type Conference proceedings
Title Note N/A
NTIS Issue Number 9308
Contract Number AC03-76SF00098

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