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Accession Number DE92041176
Title Determination of the strain field from an HREM image of a Si Lomer dislocation.
Publication Date Mar 1992
Media Count 3p
Personal Author K. H. Tsai A. F. Schwartzman R. Gallego M. Ortiz K. S. Kim
Abstract A new approach to quantitative deformation characterization of high-resolution electron microscopy (HREM) defect images has been developed. The principle of this technique, (Computational Fourier Transform Deformation (CFTD)) is to extract an accurate dis ...
Keywords Deformation
Electron Microscopy
Fourier Transformation
Image Processing
Source Agency Technical Information Center Oak Ridge Tennessee
NTIS Subject Category 99F - Physical & Theoretical Chemistry
Corporate Author Lawrence Berkeley Lab., CA.
Document Type Conference proceedings
Title Note N/A
NTIS Issue Number 9308
Contract Number AC03-76SF00098

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