Accession Number DE2013-1022033
Title Ultrasoft X-Ray Measurements of Impurity Levels in NSTX.
Publication Date 2012
Media Count 4p
Personal Author B. LeBlanc D. Gates D. Johnson D. Stutman H. Kugel J. Menard K. Fournier M. Bell M. Finkenthal R. Bell R. Kaita R. Maingi R. Vero S. Kaye V. Soukhanovskii
Abstract The soft X-ray emission from hot plasmas can be used to determine the impurity levels and profiles. This information is operationally important and can also provide information about the local particle transport. With central electron temperatures in the 0.5-1.5 keV range, the bulk NSTX emission is in the ultrasoft X-ray (0.1
Keywords Electron temperature
Emission
Fluctuations
Hot plasma
Kev range
Magnetohydrodynamics
NSTX devices
Photodiodes
Plasma diagnostics
Plasma impurities
Plasma radial profiles
Soft x-radiation
Spectrometers

 
Source Agency Technical Information Center Oak Ridge Tennessee
NTIS Subject Category 77A - Thermonuclear Fusion Devices
46G - Plasma Physics
Corporate Author Oak Ridge National Lab., TN.
Document Type Technical report
Title Note N/A
NTIS Issue Number 1323
Contract Number DE-AC05-00OR22725

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