Documents in the NTIS Technical Reports collection are the results of federally funded research. They are directly submitted to or collected by NTIS from Federal agencies for permanent accessibility to industry, academia and the public.  Before purchasing from NTIS, you may want to check for free access from (1) the issuing organization's website; (2) the U.S. Government Printing Office's Federal Digital System website; (3) the federal government Internet portal; or (4) a web search conducted using a commercial search engine such as
Accession Number DE2013-1022033
Title Ultrasoft X-Ray Measurements of Impurity Levels in NSTX.
Publication Date 2012
Media Count 4p
Personal Author B. LeBlanc D. Gates D. Johnson D. Stutman H. Kugel J. Menard K. Fournier M. Bell M. Finkenthal R. Bell R. Kaita R. Maingi R. Vero S. Kaye V. Soukhanovskii
Abstract The soft X-ray emission from hot plasmas can be used to determine the impurity levels and profiles. This information is operationally important and can also provide information about the local particle transport. With central electron temperatures in the 0.5-1.5 keV range, the bulk NSTX emission is in the ultrasoft X-ray (0.1
Keywords Electron temperature
Hot plasma
Kev range
NSTX devices
Plasma diagnostics
Plasma impurities
Plasma radial profiles
Soft x-radiation

Source Agency Technical Information Center Oak Ridge Tennessee
NTIS Subject Category 77A - Thermonuclear Fusion Devices
46G - Plasma Physics
Corporate Author Oak Ridge National Lab., TN.
Document Type Technical report
Title Note N/A
NTIS Issue Number 1323
Contract Number DE-AC05-00OR22725

Science and Technology Highlights

See a sampling of the latest scientific, technical and engineering information from NTIS in the NTIS Technical Reports Newsletter

Acrobat Reader Mobile    Acrobat Reader